6 IEDM paper accepted

Our group has 2 papers accepted , and also has 4 collaborative papers with University of Notre Dame and Purdue University to be presented at IEDM 2021 in Dec. 2020. This keeps the same productivity in IEDM papers as last year, congratulations to all the authors! So far, Prof. Yu has authored or co-authored 40 IEDM papers since 2008.

  • Y. Luo, S. Dutta, A. Kaul, S.-K. Lim, M. S. Bakir, S. Datta, S. Yu, “Monolithic 3D compute-in-memory accelerator with BEOL transistor based reconfigurable interconnect,” IEEE International Electron Devices Meeting (IEDM) 2021, invited.
  • Y.-C. Luo, J. Hur, T.-H. Wang, A. Lu, S. Li, A. I. Khan, S. Yu, “Experimental demonstration of non-volatile capacitive crossbar array for in-memory computing,” IEEE International Electron Devices Meeting (IEDM) 2021.
  • K. A. Aabrar, J. Gomez, S. G. Kirtania, M. San Jose, Y. Luo, P. G. Ravikumar, P. V. Ravindran, H. Ye, S. Banerjee, S. Dutta, A. I. Khan, S. Yu, S. Datta, “BEOL compatible superlattice FerroFET-based high precision analog weight cell with superior linearity and symmetry,” IEEE International Electron Devices Meeting (IEDM) 2021.
  • Z. Lin, M. Si, Y.-C. Luo, X. Lyu, A. Charnas, Z. Chen, Z. Yu, W. Tsai, P. C. McIntyre, R. Kanjolia, M. Moinpour, S. Yu, P. D. Ye, “High-Performance BEOL-compatible atomic-layer-deposited In2O3 Fe-FETs enabled by channel length scaling down to 7 nm: Achieving performance enhancement with large memory window of 2.2 V, long retention > 10 years and high endurance > 108 cycles,” IEEE International Electron Devices Meeting (IEDM) 2021.
  • N. Tasneem, Z. Wang, Z. Zhao, N. Upadhyay, S. Lombardo, H. Chen, J. Hur, D. Triyoso, S. Consiglio, K. Tapily, R. Clark, G. Leusink, S. Kurinec, S. Datta, S. Yu, K. Ni, M. Passlack, W. Chern, A. I. Khan, “Trap capture and emission dynamics in ferroelectric field-effect transistors and their impact on device operation and reliability,” IEEE International Electron Devices Meeting (IEDM) 2021.
  • Z. Wang, N. Tasneem, J. Hur, H. Chen, S. Yu, W. Chern, A. I. Khan, “Standby bias improvement of read after write delay in ferroelectric field effect transistors,” IEEE International Electron Devices Meeting (IEDM) 2021.